2020년도 성균관대학교 산학협력프로젝트, 2020.04 ~ 2020.12
Machine learning-based anomaly detection for smart factory
추가 문서화 예정
git을 설치한 후, clone 명령어를 이용해 해당 repository를 받으세요.
git clone https://github.com/2020-iuc-sw-skku/LSC-Systems
clone이 끝나면, data 폴더에 LSWMD.pkl을 받아주세요.
내용 추가 예정
- 소프트웨어학과 강은수 @Kang-Eunsu
- 소프트웨어학과 김주영 @illuminoplanet
- 소프트웨어학과 부윤종 @Yunjong-Boo
- 소프트웨어학과 이진우 @Jinu-Lee
- 소프트웨어학과 최재민 @dotoleeoak
- 소프트웨어학과 최현진 @HyeonjinChoi
- Thanks to 공정택 교수님
[0] A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing
[1] Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets
[3] Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis
[4] Wafer defect patterns recognition based on OPTICS and multi-label classification
[5] Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features
[6] Research on Image-Based Automatic Wafer Surface Defect Detection Algorithm