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Add new application definition for PEEM experiments
This extends NXmpes and adds some new groups and fields and also adjusts some existing fields' classes
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| <?xml version="1.0" encoding="utf-8"?> | ||
| <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?> | ||
| <!-- | ||
| # NeXus - Neutron and X-ray Common Data Format | ||
| # | ||
| # Copyright (C) 2014-2022 NeXus International Advisory Committee (NIAC) | ||
| # | ||
| # This library is free software; you can redistribute it and/or | ||
| # modify it under the terms of the GNU Lesser General Public | ||
| # License as published by the Free Software Foundation; either | ||
| # version 3 of the License, or (at your option) any later version. | ||
| # | ||
| # This library is distributed in the hope that it will be useful, | ||
| # but WITHOUT ANY WARRANTY; without even the implied warranty of | ||
| # MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU | ||
| # Lesser General Public License for more details. | ||
| # | ||
| # You should have received a copy of the GNU Lesser General Public | ||
| # License along with this library; if not, write to the Free Software | ||
| # Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA | ||
| # | ||
| # For further information, see http://www.nexusformat.org | ||
| --> | ||
| <definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" type="group" extends="NXmpes" name="NXmpes_peem" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd"> | ||
| <doc> | ||
| This is a general application definition for a photo-electron emission or low | ||
| energy electron microscopy/diffraction experiment. | ||
| </doc> | ||
| <group type="NXentry"> | ||
| <field name="definition"> | ||
| <attribute name="version" /> | ||
| <enumeration> | ||
| <item value="NXmpes_peem" /> | ||
| </enumeration> | ||
| </field> | ||
| <group type="NXmonitor" recommended="true" /> | ||
| <group type="NXinstrument"> | ||
| <group type="NXinsertion_device" optional="true" /> | ||
| <group type="NXmonochromator" recommended="true" /> | ||
| <group type="NXbeam" name="beam_probe" optional="true"> | ||
| <attribute name="flux" /> | ||
| <field name="incident_energy" type="NX_FLOAT" /> | ||
| <field name="incident_polarization_stokes" type="NX_NUMBER" /> | ||
| <field name="depends_on" /> | ||
| <group type="NXtransformations"> | ||
| <group name="direction" type="NX_number"> | ||
| <doc> | ||
| default is [0,0,1] | ||
| </doc> | ||
| </group> | ||
| <field name="reference_plane" type="NX_NUMBER"> | ||
| <doc> | ||
| defined as normal to the plane used to measure azimuth. Default is [0,1,0] | ||
| through the origin | ||
| </doc> | ||
| </field> | ||
| </group> | ||
| </group> | ||
| <group type="NXoptical_system_em"> | ||
| <field name="field_of_view" type="NX_FLOAT"> | ||
| <doc> | ||
| One or two values for size of image on sample or in another space along slow and | ||
| fast pixel dimensions. | ||
| </doc> | ||
| <attribute name="units" /> | ||
| </field> | ||
| <field name="working_distance" type="NX_FLOAT" /> | ||
| <field name="magnification" type="NX_FLOAT" /> | ||
| </group> | ||
| <group type="NXelectronanalyser"> | ||
| <group type="NXcollectioncolumn"> | ||
| <field name="scheme"> | ||
| <doc> | ||
| Scheme of the electron collection column. | ||
| </doc> | ||
| <enumeration> | ||
| <item value="standard" /> | ||
| <item value="angular dispersive" /> | ||
| <item value="selective area" /> | ||
| <item value="deflector" /> | ||
| <item value="PEEM" /> | ||
| <item value="PEEM dark-field" /> | ||
| <item value="LEEM" /> | ||
| <item value="LEEM dark-field" /> | ||
| <item value="LEED" /> | ||
| <item value="dispersive plane" /> | ||
| <item value="momentum microscope" /> | ||
| </enumeration> | ||
| </field> | ||
| <field name="mode" recommended="true"> | ||
| <doc> | ||
| Labelling of the lens setting in use | ||
| </doc> | ||
| </field> | ||
| <field name="projection"> | ||
| <doc> | ||
| The space projected in the angularly dispersive direction | ||
| </doc> | ||
| <enumeration> | ||
| <item value="real" /> | ||
| <item value="reciprocal" /> | ||
| <item value="energy" /> | ||
| </enumeration> | ||
| </field> | ||
| <group name="extractor_voltage" type="NXlens_em" /> | ||
| <group name="objective_lens" type="NXlens_em"> | ||
| <doc> | ||
| list of electromagnetic lenses of the microscope column. | ||
| </doc> | ||
| </group> | ||
| </group> | ||
| <!--other EM lenses in column--> | ||
| <group type="NXebeam_column" name="electron_gun" optional="true"> | ||
| <group name="field_aperture" type="NXaperture_em" /> | ||
| <group name="beam" type="NXbeam" /> | ||
| </group> | ||
| <group type="NXenergydispersion" optional="true"> | ||
| <group name="entrance_slit" type="NXaperture_em" optional="true"> | ||
| <doc> | ||
| Size, position and shape of the entrance slit in dispersive analyzers. To add | ||
| additional or other slits use an APERTURE group in this group. | ||
| </doc> | ||
| </group> | ||
| <group name="exit_slit" type="NXaperture_em" optional="true"> | ||
| <doc> | ||
| Size, position and shape of the exit slit in dispersive analyzers. To add | ||
| additional or other slits use an APERTURE group in this group. | ||
| </doc> | ||
| </group> | ||
| <field name="energy_interval" type="NX_FLOAT"> | ||
| <doc> | ||
| only in dispersive mode | ||
| </doc> | ||
| </field> | ||
| <field name="center_energy" type="NX_FLOAT"> | ||
| <doc> | ||
| Center of the energy window (only in dispersive mode) | ||
| </doc> | ||
| </field> | ||
| </group> | ||
| <group type="NXdetector"> | ||
| <field name="depends_on" /> | ||
| <group name="transformations" type="NXtransformations"> | ||
| <doc> | ||
| Virtual transformations to sample that map the pixels onto sample coordinates. | ||
| </doc> | ||
| </group> | ||
| <group type="NXdetector_module"> | ||
| <doc> | ||
| For detectors with irregular pixel sizes or composed by modules tiled together. | ||
| </doc> | ||
| </group> | ||
| <field name="dark_image" type="NX_NUMBER"> | ||
| <doc> | ||
| external link to a dark image file. | ||
| </doc> | ||
| </field> | ||
| <field name="flatfield_image" type="NX_NUMBER"> | ||
| <doc> | ||
| external link to a flat field image. | ||
| </doc> | ||
| </field> | ||
| <field name="data" type="NX_NUMBER" /> | ||
| </group> | ||
| <group type="NXmanipulator"> | ||
| <doc> | ||
| Manipulator for positioning and rotating of the sample. | ||
| </doc> | ||
| <group type="NXpositioner"> | ||
| <doc> | ||
| One of a group of sample positioners | ||
| </doc> | ||
| </group> | ||
| <!--other NXpositioners--> | ||
| <field name="sample_bias" type="NX_FLOAT"> | ||
| <doc> | ||
| Start voltage (sample retarding potential). | ||
| </doc> | ||
| </field> | ||
| </group> | ||
| </group> | ||
| </group> | ||
| <group name="coordinate_system_set" type="NXcoordinate_system_set"> | ||
| <doc> | ||
| Collection of useful coordinate system. The common reference system should be | ||
| the sample with all the positioner set to zero. Define at least the beam | ||
| reference at sample position and the gravity direction. Add the crystal cell | ||
| orientation if necessary. | ||
| </doc> | ||
| </group> | ||
| <group type="NXsample"> | ||
| <field name="depends_on" /> | ||
| <group type="NXtransformations"> | ||
| <doc> | ||
| The origin is at the sample position in the center of the detector field of | ||
| view, with all the manipulator positioners set to zero. | ||
| </doc> | ||
| </group> | ||
| </group> | ||
| </group> | ||
| </definition> |
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| Original file line number | Diff line number | Diff line change |
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| category: application | ||
| doc: | | ||
| This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment. | ||
| type: group | ||
| (NXmpes)NXmpes_peem: | ||
| (NXentry): | ||
| definition: | ||
| \@version: | ||
| enumeration: [NXmpes_peem] | ||
| (NXmonitor): | ||
| exists: recommended | ||
| (NXinstrument): | ||
| (NXinsertion_device): | ||
| exists: optional # only when PEEM uses synchrotron light | ||
| (NXmonochromator): # incoming_beam_monochromator | ||
| exists: recommended | ||
| (NXbeam)beam_probe: | ||
| exists: optional # as we record it in NXsample | ||
| \@flux: # that will point to the NXmonitor data field | ||
| incident_energy(NX_FLOAT): # link to monochromator energy | ||
| incident_polarization_stokes(NX_NUMBER): | ||
| depends_on: | ||
| (NXtransformations): | ||
| direction(NX_number): | ||
| doc: | ||
| default is [0,0,1] | ||
| reference_plane(NX_NUMBER): #how is that for our AC-PEEM? | ||
| doc: | ||
| defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin | ||
| (NXoptical_system_em): | ||
| field_of_view(NX_FLOAT): | ||
| doc: | | ||
| One or two values for size of image on sample or in another space along slow and fast pixel dimensions. | ||
| \@units: | ||
| working_distance(NX_FLOAT): | ||
| magnification(NX_FLOAT): | ||
| (NXelectronanalyser): | ||
| (NXcollectioncolumn): # supplement base application definition | ||
| scheme: | ||
| doc: | | ||
| Scheme of the electron collection column. | ||
| enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope] | ||
| mode: | ||
| exists: recommended | ||
| doc: | ||
| Labelling of the lens setting in use | ||
| projection: | ||
| doc: | ||
| The space projected in the angularly dispersive direction | ||
| enumeration: [real, reciprocal, energy] | ||
| extractor_voltage(NXlens_em): | ||
| objective_lens(NXlens_em): | ||
| doc: | ||
| list of electromagnetic lenses of the microscope column. | ||
| # other EM lenses in column | ||
| (NXebeam_column)electron_gun: | ||
| exists: optional # when doing LEEM/LEED | ||
| field_aperture(NXaperture_em): | ||
| beam(NXbeam): | ||
| (NXenergydispersion): | ||
| exists: optional | ||
| entrance_slit(NXaperture_em): # changed from NXaperture | ||
| exists: optional | ||
| doc: | | ||
| Size, position and shape of the entrance slit in dispersive analyzers. To add | ||
| additional or other slits use an APERTURE group in this group. | ||
| exit_slit(NXaperture_em): # changed from NXaperture | ||
| exists: optional | ||
| doc: | | ||
| Size, position and shape of the exit slit in dispersive analyzers. To add | ||
| additional or other slits use an APERTURE group in this group. | ||
| energy_interval(NX_FLOAT): | ||
| doc: | ||
| only in dispersive mode | ||
| center_energy(NX_FLOAT): | ||
| doc: | ||
| Center of the energy window (only in dispersive mode) | ||
| (NXdetector): | ||
| depends_on: | ||
| transformations(NXtransformations): | ||
| doc: | ||
| Virtual transformations to sample that map the pixels onto sample coordinates. | ||
| (NXdetector_module): | ||
| doc: | ||
| For detectors with irregular pixel sizes or composed by modules tiled together. | ||
| dark_image(NX_NUMBER): | ||
| doc: | ||
| external link to a dark image file. | ||
| flatfield_image(NX_NUMBER): | ||
| doc: | ||
| external link to a flat field image. | ||
| data(NX_NUMBER): | ||
| (NXmanipulator): | ||
| doc: | | ||
| Manipulator for positioning and rotating of the sample. | ||
| (NXpositioner): | ||
| doc: | | ||
| One of a group of sample positioners | ||
| # other NXpositioners | ||
| sample_bias(NX_FLOAT): | ||
| doc: | ||
| Start voltage (sample retarding potential). | ||
| coordinate_system_set(NXcoordinate_system_set): | ||
| doc: | ||
| Collection of useful coordinate system. The common reference system should | ||
| be the sample with all the positioner set to zero. Define at least the beam | ||
| reference at sample position and the gravity direction. | ||
| Add the crystal cell orientation if necessary. | ||
| (NXsample): | ||
| depends_on: | ||
| (NXtransformations): # links to fields in NXmanipulator | ||
| doc: | ||
| The origin is at the sample position in the center of the detector field of view, | ||
| with all the manipulator positioners set to zero. |