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Add new application definition for PEEM experiments
This extends NXmpes and adds some new groups and fields and also adjusts some existing fields' classes
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‎contributed_definitions/NXmpes_peem.nxdl.xml

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<?xml version="1.0" encoding="utf-8"?>
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<?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
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<!--
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# NeXus - Neutron and X-ray Common Data Format
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#
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# Copyright (C) 2014-2022 NeXus International Advisory Committee (NIAC)
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#
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# This library is free software; you can redistribute it and/or
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# modify it under the terms of the GNU Lesser General Public
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# License as published by the Free Software Foundation; either
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# version 3 of the License, or (at your option) any later version.
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#
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# This library is distributed in the hope that it will be useful,
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# but WITHOUT ANY WARRANTY; without even the implied warranty of
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# MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
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# Lesser General Public License for more details.
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#
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# You should have received a copy of the GNU Lesser General Public
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# License along with this library; if not, write to the Free Software
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# Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA
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#
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# For further information, see http://www.nexusformat.org
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-->
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<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" type="group" extends="NXmpes" name="NXmpes_peem" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
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<doc>
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This is a general application definition for a photo-electron emission or low
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energy electron microscopy/diffraction experiment.
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</doc>
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<group type="NXentry">
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<field name="definition">
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<attribute name="version" />
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<enumeration>
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<item value="NXmpes_peem" />
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</enumeration>
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</field>
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<group type="NXmonitor" recommended="true" />
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<group type="NXinstrument">
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<group type="NXinsertion_device" optional="true" />
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<group type="NXmonochromator" recommended="true" />
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<group type="NXbeam" name="beam_probe" optional="true">
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<attribute name="flux" />
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<field name="incident_energy" type="NX_FLOAT" />
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<field name="incident_polarization_stokes" type="NX_NUMBER" />
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<field name="depends_on" />
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<group type="NXtransformations">
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<group name="direction" type="NX_number">
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<doc>
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default is [0,0,1]
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</doc>
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</group>
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<field name="reference_plane" type="NX_NUMBER">
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<doc>
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defined as normal to the plane used to measure azimuth. Default is [0,1,0]
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through the origin
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</doc>
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</field>
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</group>
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</group>
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<group type="NXoptical_system_em">
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<field name="field_of_view" type="NX_FLOAT">
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<doc>
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One or two values for size of image on sample or in another space along slow and
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fast pixel dimensions.
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</doc>
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<attribute name="units" />
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</field>
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<field name="working_distance" type="NX_FLOAT" />
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<field name="magnification" type="NX_FLOAT" />
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</group>
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<group type="NXelectronanalyser">
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<group type="NXcollectioncolumn">
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<field name="scheme">
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<doc>
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Scheme of the electron collection column.
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</doc>
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<enumeration>
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<item value="standard" />
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<item value="angular dispersive" />
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<item value="selective area" />
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<item value="deflector" />
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<item value="PEEM" />
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<item value="PEEM dark-field" />
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<item value="LEEM" />
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<item value="LEEM dark-field" />
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<item value="LEED" />
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<item value="dispersive plane" />
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<item value="momentum microscope" />
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</enumeration>
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</field>
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<field name="mode" recommended="true">
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<doc>
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Labelling of the lens setting in use
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</doc>
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</field>
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<field name="projection">
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<doc>
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The space projected in the angularly dispersive direction
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</doc>
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<enumeration>
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<item value="real" />
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<item value="reciprocal" />
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<item value="energy" />
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</enumeration>
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</field>
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<group name="extractor_voltage" type="NXlens_em" />
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<group name="objective_lens" type="NXlens_em">
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<doc>
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list of electromagnetic lenses of the microscope column.
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</doc>
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</group>
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</group>
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<!--other EM lenses in column-->
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<group type="NXebeam_column" name="electron_gun" optional="true">
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<group name="field_aperture" type="NXaperture_em" />
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<group name="beam" type="NXbeam" />
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</group>
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<group type="NXenergydispersion" optional="true">
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<group name="entrance_slit" type="NXaperture_em" optional="true">
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<doc>
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Size, position and shape of the entrance slit in dispersive analyzers. To add
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additional or other slits use an APERTURE group in this group.
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</doc>
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</group>
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<group name="exit_slit" type="NXaperture_em" optional="true">
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<doc>
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Size, position and shape of the exit slit in dispersive analyzers. To add
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additional or other slits use an APERTURE group in this group.
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</doc>
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</group>
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<field name="energy_interval" type="NX_FLOAT">
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<doc>
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only in dispersive mode
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</doc>
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</field>
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<field name="center_energy" type="NX_FLOAT">
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<doc>
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Center of the energy window (only in dispersive mode)
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</doc>
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</field>
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</group>
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<group type="NXdetector">
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<field name="depends_on" />
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<group name="transformations" type="NXtransformations">
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<doc>
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Virtual transformations to sample that map the pixels onto sample coordinates.
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</doc>
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</group>
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<group type="NXdetector_module">
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<doc>
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For detectors with irregular pixel sizes or composed by modules tiled together.
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</doc>
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</group>
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<field name="dark_image" type="NX_NUMBER">
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<doc>
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external link to a dark image file.
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</doc>
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</field>
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<field name="flatfield_image" type="NX_NUMBER">
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<doc>
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external link to a flat field image.
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</doc>
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</field>
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<field name="data" type="NX_NUMBER" />
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</group>
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<group type="NXmanipulator">
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<doc>
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Manipulator for positioning and rotating of the sample.
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</doc>
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<group type="NXpositioner">
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<doc>
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One of a group of sample positioners
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</doc>
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</group>
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<!--other NXpositioners-->
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<field name="sample_bias" type="NX_FLOAT">
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<doc>
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Start voltage (sample retarding potential).
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</doc>
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</field>
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</group>
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</group>
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</group>
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<group name="coordinate_system_set" type="NXcoordinate_system_set">
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<doc>
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Collection of useful coordinate system. The common reference system should be
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the sample with all the positioner set to zero. Define at least the beam
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reference at sample position and the gravity direction. Add the crystal cell
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orientation if necessary.
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</doc>
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</group>
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<group type="NXsample">
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<field name="depends_on" />
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<group type="NXtransformations">
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<doc>
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The origin is at the sample position in the center of the detector field of
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view, with all the manipulator positioners set to zero.
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</doc>
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</group>
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</group>
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</group>
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</definition>

‎contributed_definitions/yaml/NXmpes_peem.yaml

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category: application
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doc: |
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This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment.
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type: group
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(NXmpes)NXmpes_peem:
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(NXentry):
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definition:
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\@version:
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enumeration: [NXmpes_peem]
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(NXmonitor):
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exists: recommended
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(NXinstrument):
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(NXinsertion_device):
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exists: optional # only when PEEM uses synchrotron light
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(NXmonochromator): # incoming_beam_monochromator
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exists: recommended
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(NXbeam)beam_probe:
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exists: optional # as we record it in NXsample
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\@flux: # that will point to the NXmonitor data field
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incident_energy(NX_FLOAT): # link to monochromator energy
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incident_polarization_stokes(NX_NUMBER):
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depends_on:
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(NXtransformations):
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direction(NX_number):
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doc:
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default is [0,0,1]
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reference_plane(NX_NUMBER): #how is that for our AC-PEEM?
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doc:
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defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin
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(NXoptical_system_em):
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field_of_view(NX_FLOAT):
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doc: |
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One or two values for size of image on sample or in another space along slow and fast pixel dimensions.
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\@units:
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working_distance(NX_FLOAT):
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magnification(NX_FLOAT):
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(NXelectronanalyser):
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(NXcollectioncolumn): # supplement base application definition
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scheme:
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doc: |
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Scheme of the electron collection column.
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enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope]
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mode:
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exists: recommended
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doc:
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Labelling of the lens setting in use
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projection:
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doc:
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The space projected in the angularly dispersive direction
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enumeration: [real, reciprocal, energy]
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extractor_voltage(NXlens_em):
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objective_lens(NXlens_em):
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doc:
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list of electromagnetic lenses of the microscope column.
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# other EM lenses in column
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(NXebeam_column)electron_gun:
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exists: optional # when doing LEEM/LEED
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field_aperture(NXaperture_em):
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beam(NXbeam):
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(NXenergydispersion):
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exists: optional
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entrance_slit(NXaperture_em): # changed from NXaperture
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exists: optional
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doc: |
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Size, position and shape of the entrance slit in dispersive analyzers. To add
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additional or other slits use an APERTURE group in this group.
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exit_slit(NXaperture_em): # changed from NXaperture
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exists: optional
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doc: |
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Size, position and shape of the exit slit in dispersive analyzers. To add
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additional or other slits use an APERTURE group in this group.
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energy_interval(NX_FLOAT):
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doc:
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only in dispersive mode
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center_energy(NX_FLOAT):
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doc:
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Center of the energy window (only in dispersive mode)
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(NXdetector):
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depends_on:
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transformations(NXtransformations):
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doc:
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Virtual transformations to sample that map the pixels onto sample coordinates.
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(NXdetector_module):
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doc:
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For detectors with irregular pixel sizes or composed by modules tiled together.
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dark_image(NX_NUMBER):
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doc:
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external link to a dark image file.
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flatfield_image(NX_NUMBER):
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doc:
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external link to a flat field image.
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data(NX_NUMBER):
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(NXmanipulator):
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doc: |
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Manipulator for positioning and rotating of the sample.
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(NXpositioner):
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doc: |
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One of a group of sample positioners
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# other NXpositioners
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sample_bias(NX_FLOAT):
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doc:
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Start voltage (sample retarding potential).
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coordinate_system_set(NXcoordinate_system_set):
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doc:
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Collection of useful coordinate system. The common reference system should
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be the sample with all the positioner set to zero. Define at least the beam
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reference at sample position and the gravity direction.
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Add the crystal cell orientation if necessary.
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(NXsample):
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depends_on:
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(NXtransformations): # links to fields in NXmanipulator
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doc:
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The origin is at the sample position in the center of the detector field of view,
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with all the manipulator positioners set to zero.

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