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mpesopticalDomain of optical characterization methods, NXopt, NXraman, NXellips, etc.Domain of optical characterization methods, NXopt, NXraman, NXellips, etc.spmPRs related to research in the domain of scanning probe microscopyPRs related to research in the domain of scanning probe microscopy
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As discussed already a couple of times, it would be very beneficial to have a base class to describe the procedure how data have been acquired. E.g. if a scan is repeated multiple times, and then averaged, this should be documented, in which order and how many times this was repeated. Also, how different scans that relate to each other were collected should be recorded.
I am not sure if this makes sense to define on the NXroot level, or NXentry, or both.
@sanbrock @lukaspie @RonHildebrandt
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mpesopticalDomain of optical characterization methods, NXopt, NXraman, NXellips, etc.Domain of optical characterization methods, NXopt, NXraman, NXellips, etc.spmPRs related to research in the domain of scanning probe microscopyPRs related to research in the domain of scanning probe microscopy