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on_the_fly_assessment

The examples on how to use the code can be found in the paper below. If the code is helpful for you, please cite this paper.

"On-the-Fly Data Assessment for High-Throughput X-ray Diffraction Measurements" authored by Fang Ren, Ronald Pandolfi, Douglas Van Campen, Alexander Hexemer, and Apurva Mehta, published in ACS Combinatorial Science (2017).