modify current doc.

[RubelMozumder]

Summary by Sourcery

Modify documentation for scanning probe microscopy (SPM) related YAML and NXDL files, focusing on current and calibration descriptions

Enhancements:

• Refine the description of current measurements to specify it as a setpoint or target value
• Improve clarity of calibration documentation for piezo devices

Documentation:

• Update documentation for current descriptions in NXstm and NXspm to clarify the meaning of current measurements
• Add documentation for piezo device calibration in NXpiezo_config_spm

[sourcery-ai]

Reviewer's Guide by Sourcery

This pull request modifies the documentation and structure of several NeXus definitions. It removes the current field from NXstm, updates the documentation for the current field in NXspm, and adds documentation for the calibration group in NXpiezo_config_spm. Additionally, the SHA hashes in the YAML files have been updated to reflect these changes.

Updated class diagram for NXspm

classDiagram
    class NXspm {
        +current: NX_NUMBER
        +current_offset: NX_NUMBER
        --
        +current: The DC current between tip and sample.
        --
        +current: Current setpoint or target value of the tunneling current between tip and sample after applying bias voltage.
    }
    note for NXspm.current "Updated documentation for current field"

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Updated class diagram for NXpiezo_config_spm

classDiagram
    class NXpiezo_config_spm {
        +calibration: NXcalibration
    }
    class NXcalibration {
        +calibration_type: NX_CHAR
    }
    NXpiezo_config_spm -- NXcalibration : has a
    note for NXpiezo_config_spm.calibration "Added documentation for calibration group"

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Updated class diagram for NXstm

classDiagram
    class NXstm {
        -current: NX_NUMBER
        +current_offset: NX_NUMBER
    }
    note for NXstm.current "Removed current field"

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File-Level Changes

Change	Details	Files
Removed the current field from the NXstm class.	Removed the current field and its documentation from the NXstm class in both the YAML and XML files.	contributed_definitions/nyaml/NXstm.yaml contributed_definitions/NXstm.nxdl.xml
Updated the documentation of the current field in the NXspm class.	Modified the description of the current field in the NXspm class to specify that it represents the current setpoint or target value. Updated the documentation in both the YAML and XML files.	contributed_definitions/nyaml/NXspm.yaml contributed_definitions/NXspm.nxdl.xml
Added documentation for the calibration group in NXpiezo_config_spm.	Added a doc field to the calibration group in both the YAML and XML files to describe the calibration of the piezo device.	contributed_definitions/nyaml/NXpiezo_config_spm.yaml contributed_definitions/NXpiezo_config_spm.nxdl.xml
Updated SHA hashes in definition files.	Updated the SHA hashes in the NXstm.yaml, NXspm.yaml, and NXpiezo_config_spm.yaml files to reflect the changes made to the files.	contributed_definitions/nyaml/NXstm.yaml contributed_definitions/nyaml/NXspm.yaml contributed_definitions/nyaml/NXpiezo_config_spm.yaml

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[sourcery-ai]

Hey @RubelMozumder - I've reviewed your changes - here's some feedback:

Overall Comments:

• The SHA hash in the YAML files should be updated automatically by a script.
• The changes touch both the YAML and XML definitions - it would be good to keep these in sync.

Here's what I looked at during the review

• 🟢 General issues: all looks good
• 🟢 Security: all looks good
• 🟢 Testing: all looks good
• 🟢 Complexity: all looks good
• 🟢 Documentation: all looks good

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[mkuehbach]

@RubelMozumder sourcery is extremely verbose here, we should have a clean one liner that explains what this PR is about and which technique (spm, xps, etc.) it provides changes for, thank you