Skip to content

Commit

Permalink
Update mpes_peem definition
Browse files Browse the repository at this point in the history 
Move YAML to nyaml directory, tweak PEEM definition according to feedback, and add some units
  • Loading branch information
@PeterC-DLS
PeterC-DLS committed Jan 15, 2024
1 parent 228a4c6 commit 3f4909a
Show file tree
Hide file tree
Showing 2 changed files with 64 additions and 98 deletions.
87 changes: 27 additions & 60 deletions contributed_definitions/NXmpes_peem.nxdl.xml
View file
Original file line number Diff line number Diff line change
Expand Up @@ -21,7 +21,7 @@
#
# For further information, see http://www.nexusformat.org
-->
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" type="group" extends="NXmpes" name="NXmpes_peem" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" name="NXmpes_peem" extends="NXmpes" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<doc>
This is a general application definition for a photo-electron emission or low
energy electron microscopy/diffraction experiment.
Expand All @@ -33,22 +33,34 @@
<item value="NXmpes_peem" />
</enumeration>
</field>
<group type="NXmonitor" recommended="true" />
<group type="NXmonitor" recommended="true">
<doc>
contains field named in the **flux** attribute of :ref:`NXbeam`
</doc>
</group>
<group type="NXinstrument">
<group type="NXinsertion_device" optional="true" />
<group type="NXmonochromator" recommended="true" />
<group type="NXbeam" name="beam_probe" optional="true">
<group name="beam_probe" type="NXbeam" optional="true">
<attribute name="flux" />
<field name="incident_energy" type="NX_FLOAT" />
<field name="incident_polarization_stokes" type="NX_NUMBER" />
<field name="incident_energy" type="NX_FLOAT" units="NX_ENERGY">
<doc>
this should be a link to monochromator energy
</doc>
</field>
<field name="incident_polarization_stokes" type="NX_NUMBER" recommended="true">
<doc>
use this or **incident_polarization**
</doc>
</field>
<field name="depends_on" />
<group type="NXtransformations">
<group name="direction" type="NX_number">
<group name="direction" type="NX_number" recommended="true">
<doc>
default is [0,0,1]
</doc>
</group>
<field name="reference_plane" type="NX_NUMBER">
<field name="reference_plane" type="NX_NUMBER" recommended="true">
<doc>
defined as normal to the plane used to measure azimuth. Default is [0,1,0]
through the origin
Expand All @@ -57,41 +69,17 @@
</group>
</group>
<group type="NXoptical_system_em">
<field name="field_of_view" type="NX_FLOAT">
<field name="field_of_view" type="NX_FLOAT" units="NX_LENGTH">
<doc>
One or two values for size of image on sample or in another space along slow and
fast pixel dimensions.
</doc>
<attribute name="units" />
</field>
<field name="working_distance" type="NX_FLOAT" />
<field name="working_distance" type="NX_FLOAT" units="NX_LENGTH" />
<field name="magnification" type="NX_FLOAT" />
</group>
<group type="NXelectronanalyser">
<group type="NXcollectioncolumn">
<field name="scheme">
<doc>
Scheme of the electron collection column.
</doc>
<enumeration>
<item value="standard" />
<item value="angular dispersive" />
<item value="selective area" />
<item value="deflector" />
<item value="PEEM" />
<item value="PEEM dark-field" />
<item value="LEEM" />
<item value="LEEM dark-field" />
<item value="LEED" />
<item value="dispersive plane" />
<item value="momentum microscope" />
</enumeration>
</field>
<field name="mode" recommended="true">
<doc>
Labelling of the lens setting in use
</doc>
</field>
<field name="projection">
<doc>
The space projected in the angularly dispersive direction
Expand All @@ -102,37 +90,25 @@
<item value="energy" />
</enumeration>
</field>
<group name="extractor_voltage" type="NXlens_em" />
<field name="extractor_voltage" type="NX_FLOAT" units="NX_VOLTAGE" />
<group name="objective_lens" type="NXlens_em">
<doc>
list of electromagnetic lenses of the microscope column.
</doc>
</group>
</group>
<!--other EM lenses in column-->
<group type="NXebeam_column" name="electron_gun" optional="true">
<group name="electron_gun" type="NXebeam_column" optional="true">
<group name="field_aperture" type="NXaperture_em" />
<group name="beam" type="NXbeam" />
</group>
<group type="NXenergydispersion" optional="true">
<group name="entrance_slit" type="NXaperture_em" optional="true">
<doc>
Size, position and shape of the entrance slit in dispersive analyzers. To add
additional or other slits use an APERTURE group in this group.
</doc>
</group>
<group name="exit_slit" type="NXaperture_em" optional="true">
<doc>
Size, position and shape of the exit slit in dispersive analyzers. To add
additional or other slits use an APERTURE group in this group.
</doc>
</group>
<field name="energy_interval" type="NX_FLOAT">
<field name="energy_interval" type="NX_FLOAT" optional="true" units="NX_ENERGY">
<doc>
only in dispersive mode
</doc>
</field>
<field name="center_energy" type="NX_FLOAT">
<field name="center_energy" type="NX_FLOAT" optional="true" units="NX_ENERGY">
<doc>
Center of the energy window (only in dispersive mode)
</doc>
Expand All @@ -152,7 +128,7 @@
</group>
<field name="dark_image" type="NX_NUMBER">
<doc>
external link to a dark image file.
external link to a dark image.
</doc>
</field>
<field name="flatfield_image" type="NX_NUMBER">
Expand All @@ -172,7 +148,7 @@
</doc>
</group>
<!--other NXpositioners-->
<field name="sample_bias" type="NX_FLOAT">
<field name="sample_bias" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Start voltage (sample retarding potential).
</doc>
Expand All @@ -188,14 +164,5 @@
orientation if necessary.
</doc>
</group>
<group type="NXsample">
<field name="depends_on" />
<group type="NXtransformations">
<doc>
The origin is at the sample position in the center of the detector field of
view, with all the manipulator positioners set to zero.
</doc>
</group>
</group>
</group>
</definition>
75 changes: 37 additions & 38 deletions ...ributed_definitions/yaml/NXmpes_peem.yaml → ...ibuted_definitions/nyaml/NXmpes_peem.yaml
View file
Original file line number Diff line number Diff line change
@@ -1,78 +1,76 @@
category: application
doc: |
This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment.
type: group
(NXmpes)NXmpes_peem:
category: application
NXmpes_peem(NXmpes):
(NXentry):
definition:
\@version:
enumeration: [NXmpes_peem]
(NXmonitor):
exists: recommended
doc: contains field named in the **flux** attribute of :ref:`NXbeam`
(NXinstrument):
(NXinsertion_device):
exists: optional # only when PEEM uses synchrotron light
(NXmonochromator): # incoming_beam_monochromator
exists: recommended
(NXbeam)beam_probe:
beam_probe(NXbeam):
exists: optional # as we record it in NXsample
\@flux: # that will point to the NXmonitor data field
incident_energy(NX_FLOAT): # link to monochromator energy
incident_energy(NX_FLOAT):
units: NX_ENERGY
doc: this should be a link to monochromator energy
incident_polarization_stokes(NX_NUMBER):
exists: recommended
doc: use this or **incident_polarization**
depends_on:
(NXtransformations):
direction(NX_number):
exists: recommended
doc:
default is [0,0,1]
reference_plane(NX_NUMBER): #how is that for our AC-PEEM?
doc:
defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin
exists: recommended
doc:
defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin
(NXoptical_system_em):
field_of_view(NX_FLOAT):
doc: |
units: NX_LENGTH
doc:
One or two values for size of image on sample or in another space along slow and fast pixel dimensions.
\@units:
working_distance(NX_FLOAT):
units: NX_LENGTH
magnification(NX_FLOAT):
(NXelectronanalyser):
(NXcollectioncolumn): # supplement base application definition
scheme:
doc: |
Scheme of the electron collection column.
enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope]
mode:
exists: recommended
doc:
Labelling of the lens setting in use
scheme:
doc: |
Scheme of the electron collection column.
enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope]
projection:
doc:
The space projected in the angularly dispersive direction
enumeration: [real, reciprocal, energy]
extractor_voltage(NXlens_em):
extractor_voltage(NX_FLOAT):
units: NX_VOLTAGE
objective_lens(NXlens_em):
doc:
list of electromagnetic lenses of the microscope column.
# other EM lenses in column
(NXebeam_column)electron_gun:
electron_gun(NXebeam_column):
exists: optional # when doing LEEM/LEED
field_aperture(NXaperture_em):
beam(NXbeam):
(NXenergydispersion):
exists: optional
entrance_slit(NXaperture_em): # changed from NXaperture
exists: optional
doc: |
Size, position and shape of the entrance slit in dispersive analyzers. To add
additional or other slits use an APERTURE group in this group.
exit_slit(NXaperture_em): # changed from NXaperture
exists: optional
doc: |
Size, position and shape of the exit slit in dispersive analyzers. To add
additional or other slits use an APERTURE group in this group.
energy_interval(NX_FLOAT):
exists: optional
units: NX_ENERGY
doc:
only in dispersive mode
center_energy(NX_FLOAT):
exists: optional
units: NX_ENERGY
doc:
Center of the energy window (only in dispersive mode)
(NXdetector):
Expand All @@ -85,19 +83,20 @@ type: group
For detectors with irregular pixel sizes or composed by modules tiled together.
dark_image(NX_NUMBER):
doc:
external link to a dark image file.
external link to a dark image.
flatfield_image(NX_NUMBER):
doc:
external link to a flat field image.
data(NX_NUMBER):
(NXmanipulator):
doc: |
doc:
Manipulator for positioning and rotating of the sample.
(NXpositioner):
doc: |
doc:
One of a group of sample positioners
# other NXpositioners
sample_bias(NX_FLOAT):
units: NX_VOLTAGE
doc:
Start voltage (sample retarding potential).
coordinate_system_set(NXcoordinate_system_set):
Expand All @@ -106,9 +105,9 @@ type: group
be the sample with all the positioner set to zero. Define at least the beam
reference at sample position and the gravity direction.
Add the crystal cell orientation if necessary.
(NXsample):
depends_on:
(NXtransformations): # links to fields in NXmanipulator
doc:
The origin is at the sample position in the center of the detector field of view,
with all the manipulator positioners set to zero.
(NXsample):
depends_on:
(NXtransformations): # links to fields in NXmanipulator
doc:
The origin is at the sample position in the center of the detector field of view,
with all the manipulator positioners set to zero.

0 comments on commit 3f4909a

Please sign in to comment.